IEC 63202-1:2019 pdf download – Photovoltaic cells – Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells

IEC 63202-1:2019 provides the procedures for evaluating the light-induced degradation (LID) that affects crystalline silicon photovoltaic (PV) cells under simulated sunlight conditions. The severity of LID in a crystalline silicon PV cell is assessed through a comparison of its maximum power output at Standard Test Conditions (STC) both before and after being subjected to simulated sunlight at specific temperatures and light intensities. The primary goal of this standard is to offer a standardized set of data on PV cell LID, which can aid PV module producers in minimizing the variations among cells within a single module, thereby optimizing the overall power generation efficiency.