IEC 63155:2020 outlines the testing procedures for evaluating the durability of radio frequency (RF) surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices, such as filters and duplexers, when subjected to high-power RF signals. These components are utilized in various fields, including telecommunications, measurement devices, radar systems, and consumer electronics. RF BAW devices are divided into two categories: those based on film bulk acoustic resonator (FBAR) technology and those that use solidly mounted resonator (SMR) technology.

IEC 63155:2020 discusses the key failure characteristics of RF SAW/BAW devices and provides guidance on setting up the measurement system and the procedures for estimating the time to failure (TF). Since TF is primarily determined by the RF power applied to the devices, the emphasis is placed on power durability.

The aim of this document is not to explore theoretical concepts or to address every potential situation that may arise in practical applications. Instead, it draws attention to essential considerations that users should take into account before purchasing RF SAW/BAW devices for new applications. This approach helps users prevent inadequate performance and premature failure of devices due to exposure to high power levels.